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Volumn 200, Issue 2, 1997, Pages 385-393
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X-ray diffraction study of amorphous Ge(Se1-xTex)2 alloys
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0031479091
PISSN: 03701972
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-3951(199704)200:2<385::AID-PSSB385>3.0.CO;2-I Document Type: Article |
Times cited : (5)
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References (18)
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