Powder diffraction data and Rietveld refinement of metastable t-ZrO2 at low temperature

Powder Diffraction

Volumn 12, Issue 2, 1997, Pages 96-98

  Malek J ^a   Benes L ^a   Mitsuhashi, T ^b  

^a UNIVERSITY OF PARDUBICE   (Czech Republic)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; TEMPERATURE; X RAY POWDER DIFFRACTION; ZIRCONIA; ZIRCONIUM ALLOYS;

LOW TEMPERATURES; POWDER DIFFRACTION; RIETVELD TECHNIQUE; SPACE GROUPS; UNIT-CELL DIMENSIONS; X-RAY POWDER;

RIETVELD REFINEMENT;

EID: 0031475380     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/S0885715600009519     Document Type: Article

References (14)

1. Argyriou, D.N., and Howard, C.J. (1995). "Re-investigation of Yttria-Tetragonal Zirconia Polycrystal (Y-TZP) by Neutron Powder Diffraciton-a Cautionary Tale," J. Appl. Crystallogr. 28, 206-208.
2. Cyprés, R., Wollast, R., and Raucq, J. (1963). "Contribution on the Polymorphic Conversion of Pure Zirconia," Ber. Dtsch. Keram. Ges. 40, 527-532.
3. Garvie, R.C. (1965). "Occurrence of Metastable Tetragonal Zirconia as a Crystallite Size Effect," J. Phys. Chem. 69, 1238-1243.
4. 2." J. Am. Ceram. Soc. 54, 531.
5. Livage, J., Doi, K., and Maziéres, C. (1968). "Nature and Thermal Evolution of Amorphous Hydrated Zirconium Oxide," J. Am. Ceram. Soc. 51, 349-353.
6. 2)," Acta Crystallogr. 12, 507-511.
7. 2," J. Am. Ceram. Soc. 57, 97-101.
8. Smith, D.K., and Cline, C.F. (1962). "Verification of Existence of Cubic Zirconia at High Temperature," J. Am. Ceram. Soc. 45, 249-250.
9. Smith, G.S., and Snyder, R.L. (1979). "A criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexing," J. Appl. Crystallogr. 12, 60-65.
10. Subbarao, E.C. (1981). "Zirconia - an overview," in Advances in Ceramics, Science and Technology of Zirconia, Vol. 3, edited by A.H. Heuer, and L.W. Hobbs (The Americam Ceramic Society, New York, 1981), pp. 1-13.
11. 2 Powder Under Hydrothermal Conditions," J. Am. Ceram. Soc. 66, 11-14.
12. 2," Acta Crystallogr. 15, 1187.
13. Wiles, D.B., and Young, R.A. (1982). "A new computer program for Rietveld analysis of X-ray powder diffraction patterns," J. Appl. Cryst. 15, 149; see also Wiles, D.B., Sakthivel, A., and Young, R.A. (1990), Program DBW3.2S-PC-9005 (School of Physics, Georgia Institute of Technology, Atlanta, GA-30332, USA).
14. Wiles, D.B., and Young, R.A. (1982). "A new computer program for Rietveld analysis of X-ray powder diffraction patterns," J. Appl. Cryst. 15, 149; see also Wiles, D.B., Sakthivel, A., and Young, R.A. (1990), Program DBW3.2S-PC-9005 (School of Physics, Georgia Institute of Technology, Atlanta, GA-30332, USA).