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Volumn 204, Issue 1, 1997, Pages 531-533
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Modeling of submicron Si1-xGex-based MOSFETs by self-consistent Monte Carlo simulation
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0031475325
PISSN: 03701972
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-3951(199711)204:1<531::AID-PSSB531>3.0.CO;2-6 Document Type: Article |
Times cited : (4)
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References (6)
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