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Volumn 9, Issue 2, 1997, Pages 193-203

Application of the Yale Technology Concordance to the construction of international spillover variables for India

(1)  Fikkert, B a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

RESEARCH AND DEVELOPMENT; TECHNOLOGY SPILLOVER; YAL TECHNOLOGY CONCORDANCE; YALE TECHNOLOGY CONCORDANCE;

EID: 0031444164     PISSN: 09535314     EISSN: None     Source Type: Journal    
DOI: 10.1080/09535319700000013     Document Type: Article
Times cited : (3)

References (0)
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