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Volumn 46, Issue 6, 1997, Pages 457-466

Studies on the SEM examination of un-coated non-conductive specimens prepared by plasma-ion shower method

Author keywords

EPMA analysis; Non conductive specimen; Plasma ion shower; SEM examination; Un coated specimens

Indexed keywords

ANIMALIA; GLOMERULUS;

EID: 0031425990     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023543     Document Type: Article
Times cited : (1)

References (6)
  • 1
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    • Observations on uncoated, non conducting or thermally sensitive specimens using a fast scanning field emission source scanning electron microscopy
    • Welter L M and McKee A N (1972) Observations on uncoated, non conducting or thermally sensitive specimens using a fast scanning field emission source scanning electron microscopy. Proc. 5th Annu. SEM Symp. 1972:161-168.
    • (1972) Proc. 5th Annu. SEM Symp. , vol.1972 , pp. 161-168
    • Welter, L.M.1    McKee, A.N.2
  • 2
    • 0018105992 scopus 로고
    • Charge neutralization of insulating surfaces in the SEM by gas ionization
    • Moncrieff D A, Robinson V N E and Harris L B (1978) Charge neutralization of insulating surfaces in the SEM by gas ionization. J. Phys. D: Appl. Phys., 11: 2135-2325.
    • (1978) J. Phys. D: Appl. Phys. , vol.11 , pp. 2135-2325
    • Moncrieff, D.A.1    Robinson, V.N.E.2    Harris, L.B.3
  • 3
    • 0018610723 scopus 로고
    • Charge neutralization using very low energy ions
    • ed O'Hare A M F, (SEM Inc., Chicago)
    • Crawford C K (1979) Charge neutralization using very low energy ions. In: Scanning Electron Microscopy II, ed O'Hare A M F, pp. 31-46, (SEM Inc., Chicago).
    • (1979) Scanning Electron Microscopy II , pp. 31-46
    • Crawford, C.K.1
  • 4
    • 0019224846 scopus 로고
    • Ion charge neutralization effects in scanning electron microscopes
    • ed. O'Hare A M F, (SEM Inc., Chicago)
    • Crawford C K (1980) Ion charge neutralization effects in scanning electron microscopes. In: Scanning Electron Microscopy IV, ed. O'Hare A M F, pp. 11-25, (SEM Inc., Chicago).
    • (1980) Scanning Electron Microscopy IV , pp. 11-25
    • Crawford, C.K.1
  • 5
    • 0020330048 scopus 로고
    • Uncoated observation and etching of non-conductive materials by ion beam bombardment in scanning electron microscopy
    • ed. O'Hare A M F, (SEM Inc., Chicago)
    • Kanaya K, Muranaka Y and Fujita H (1982) Uncoated observation and etching of non-conductive materials by ion beam bombardment in scanning electron microscopy. In: Scanning Electron Microscopy VI, ed. O'Hare A M F, pp. 1379-1394, (SEM Inc., Chicago).
    • (1982) Scanning Electron Microscopy VI , pp. 1379-1394
    • Kanaya, K.1    Muranaka, Y.2    Fujita, H.3
  • 6
    • 0000182428 scopus 로고
    • Ueber duenne aus Kohlenwasserstoffen durch Electronen-oder Ionenbeschuss gebildete Schichten
    • Koenig H und Helwig G (1951) Ueber duenne aus Kohlenwasserstoffen durch Electronen-oder Ionenbeschuss gebildete Schichten. Z. Phys., 491-503.
    • (1951) Z. Phys. , pp. 491-503
    • Koenig, H.1    Helwig, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.