Potential use of doubled haploid lines for the screening of resistance to yellow rust (Puccinia striiformis) in hexaploid wheat

Plant Breeding

Volumn 116, Issue 6, 1997, Pages 595-597

  Moieni, A ^a   De Vallavieille Pope, C ^b   Sarrafi, A ^a  

^a UNIVERSITÉ DE TOULOUSE   (France)

^b CEMAGREF   (France)

Author keywords

Anther culture; Disease resistance; Doubled haploid lines; Triticum aestivum; Yellow rust

Indexed keywords

PUCCINIA STRIIFORMIS;

EID: 0031417541     PISSN: 01799541     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1439-0523.1997.tb02197.x     Document Type: Article

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