Viscoelastic relaxation measurements in the system SiO2-NaAlSiO4 by photon correlation spectroscopy

American Mineralogist

Volumn 82, Issue 11-12, 1997, Pages 1063-1072

  Siewert, Ralf ^a,b   Rosenhauer, Matthias ^b  

^a UNIVERSITÉ GUSTAVE EIFFEL   (France)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; FELDSPAR; PHOTONS; QUANTUM OPTICS; RELAXATION TIME; SILICA; SILICON; SODIUM COMPOUNDS; SPECIFIC HEAT; STRAIN; STRAIN RELAXATION; SUPERCOOLING; TEMPERATURE DISTRIBUTION; VISCOSITY MEASUREMENT;

ISOTHERMAL RELAXATION; MECHANICAL PERTURBATIONS; RELAXATION TIME DISTRIBUTION; SINGLE RELAXATION TIME; SUPERCOOLED LIQUIDS; TEMPERATURE DEPENDENCE; TIME CORRELATION FUNCTIONS; VISCOELASTIC RELAXATION;

PHOTON CORRELATION SPECTROSCOPY;

PHOTON CORRELATION SPECTROSCOPY; SILICATE LIQUID; VISCOELASTIC RELAXATION;

EID: 0031405041     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-1997-11-1203     Document Type: Article

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