AVA migration and multiscale characterization in finely layered media

Journal of Seismic Exploration

Volumn 6, Issue 2-3, 1997, Pages 181-198

  Wapenaar, Kees ^a   Van Geloven, Wim ^a   Goudswaard, Jeroen ^a   Van Wijngaarden, Aart Jan ^a   Dessing, Frank ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Angle dependent; Dispersion; Fine layering; Interference; Multiscale; Singularities

Indexed keywords

AMPLITUDE-VERSUS-ANGLE; DISPERSION; INTERFERENCE; LAYERING;

EID: 0031399712     PISSN: 09630651     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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