New technique for investigation of solar cells sheet resistance distribution by laser beam scanning

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3359, Issue , 1997, Pages 408-415

  Goncharov, V ^a   Ilchenko, L ^a   Kilchitskaya, S ^a   Litvinenko, S ^a   Smirnov, E ^a  

^a TARAS SHEVCHENKO NATIONAL UNIVERSITY OF KYIV   (Ukraine)

Author keywords

Difference phase; Laser beam scanning; Local characterization; Parameters mapping; Potential distribution; Sheet resistance; Solar cell

Indexed keywords

CHARACTERIZATION; ELECTRIC RESISTANCE MEASUREMENT; INDUCED CURRENTS; LASER BEAMS; LIGHTING; NONDESTRUCTIVE EXAMINATION; OPTICAL MICROSCOPY; QUANTUM EFFICIENCY; SCANNING; TWO DIMENSIONAL; VOLTAGE MEASUREMENT;

ACOUSTO-OPTICAL SCANNING; LASER BEAM INDUCED CURRENT; LASER BEAM SCANNING; LASER SCANNING MICROSCOPE; LOCAL CHARACTERIZATION; PARAMETERS MAPPING; POTENTIAL DISTRIBUTION; SOLAR CELL EMITTER; VOLTAGE DROP;

SOLAR CELLS;

EID: 0031392858     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.306253     Document Type: Conference Paper

References (6)

1. Dual beam dual frequency scanning laser radar for investigation of ablation profiles
2. Forward bias shunt hunting in solar cells by dynamical precision contact thermography
3. Hot spots and heavily dislocated regions in multicrystalline silicon cells
4. Analysis and minimisation of resistive losses in high efficiency Si solar cells by combining measurements with numerical modelling
5. Method of investigation of the relief and phase objects in laser scanning microscope and the device for its realization