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Volumn 9, Issue 5, 1997, Pages 965-968

A new tool to treat peak overlaps in electron-probe microanalysis of rare-earth-element L-series X-rays

Author keywords

Electron microprobe; LiF and PET monochromators; Monazite; Overlap standard; Rare earth element fluorides

Indexed keywords

DATA HANDLING; FLUORINE COMPOUNDS; LITHIUM COMPOUNDS; MONAZITE; PHOSPHATE MINERALS; PROBES; RARE EARTH COMPOUNDS; RARE EARTH ELEMENTS; RARE EARTHS; X RAYS;

EID: 0031392454     PISSN: 09351221     EISSN: None     Source Type: Journal    
DOI: 10.1127/ejm/9/5/0965     Document Type: Article
Times cited : (15)

References (7)
  • 1
    • 0001872092 scopus 로고
    • An improved interference correction for trace element analysis
    • Donavan, J.J., Snyder, D.A., Rivers, M.L. (1993): An improved interference correction for trace element analysis. Microbeam Analysis, 2, 23-28.
    • (1993) Microbeam Analysis , vol.2 , pp. 23-28
    • Donavan, J.J.1    Snyder, D.A.2    Rivers, M.L.3
  • 2
    • 0000427889 scopus 로고
    • New rare earth element standards for electron microprobe analysis
    • Drake, M.J. & Weill, D.F. (1972): New rare earth element standards for electron microprobe analysis Chemical Geol., 10, 179-191.
    • (1972) Chemical Geol. , vol.10 , pp. 179-191
    • Drake, M.J.1    Weill, D.F.2
  • 3
    • 84981791458 scopus 로고
    • Background determination in WDSEPMA: Some difficulties and presentation of a new analytical model
    • Fialin, M. (1992): Background determination in WDSEPMA: some difficulties and presentation of a new analytical model. X-ray Spectrom., 21, 175-181.
    • (1992) X-ray Spectrom. , vol.21 , pp. 175-181
    • Fialin, M.1
  • 4
    • 0343489904 scopus 로고
    • A survey of electron probe microanalysis using soft radiations: Difficulties and presentation of a new computer program for wavelength dispersive spectrometry
    • Proceedings of the 11th Pfefferkorn Conference, Amherst (MA). August 9-14, 1992
    • Fialin, M., Hénoc, J., Rémond, G. (1993) A survey of electron probe microanalysis using soft radiations: difficulties and presentation of a new computer program for wavelength dispersive spectrometry. Scanning Microscopy, supplem. 7, 135-166. Proceedings of the 11th Pfefferkorn Conference, Amherst (MA). August 9-14, 1992.
    • (1993) Scanning Microscopy, Supplem. , vol.7 , pp. 135-166
    • Fialin, M.1    Hénoc, J.2    Rémond, G.3
  • 5
    • 0000076249 scopus 로고
    • Un nouveau modèle de calcul pour la microanalyse quantitative par spectrométrie de rayons X. Partie I: Application à l'analyse des échantillons homogènes
    • Pouchou, J.L. & Pichoir, F. (1984): Un nouveau modèle de calcul pour la microanalyse quantitative par spectrométrie de rayons X. Partie I: application à l'analyse des échantillons homogènes. La Recherche Aérospatiale, 3, 167-192.
    • (1984) La Recherche Aérospatiale , vol.3 , pp. 167-192
    • Pouchou, J.L.1    Pichoir, F.2
  • 6
    • 0024955903 scopus 로고
    • Analytical description of X-ray peaks: Application to L X-Ray spectra processing of lanthanide elements by means of the electron probe microanalyzer
    • Rémond, G., Coutures, Ph., Gilles, C., Massiot, D. (1989): Analytical description of X-ray peaks: application to L X-Ray spectra processing of lanthanide elements by means of the electron probe microanalyzer. Scanning Microscopy, 3-4, 1059-1086.
    • (1989) Scanning Microscopy , vol.3-4 , pp. 1059-1086
    • Rémond, G.1    Coutures, Ph.2    Gilles, C.3    Massiot, D.4
  • 7
    • 0022217753 scopus 로고
    • Electron microprobe analysis of minerals for rare earth elements: Use of the calculated peak-overlap correction
    • Roeder, P.L. (1985): Electron microprobe analysis of minerals for rare earth elements: use of the calculated peak-overlap correction. Can. Mineral., 23, 263-271.
    • (1985) Can. Mineral. , vol.23 , pp. 263-271
    • Roeder, P.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.