Distance measurement method available to texture surface by using complex-log mapping

IECON Proceedings (Industrial Electronics Conference)

Volumn 3, Issue , 1997, Pages 1157-1162

  Yamguti, Naoki ^a   Oe, Shunichiro ^a   Terada, Kenji ^a  

^a UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; DISTANCE MEASUREMENT; TEXTURES;

COMPLEX LOG MAPPING;

OBJECT RECOGNITION;

EID: 0031389536     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (4)