A programme for the future?

Materials Science Forum

Volumn 258-263, Issue PART 1, 1997, Pages 27-34

  Stoneham, A M ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

Defects; Excited states; Processing; Semiconductors

Indexed keywords

CRYSTAL DEFECTS; ELECTRON ENERGY LEVELS; RELIABILITY; SEMICONDUCTOR DEVICES; TECHNOLOGICAL FORECASTING;

MICROELECTRONIC COMPONENTS;

MICROELECTRONIC PROCESSING;

EID: 0031389471     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.258-263.27     Document Type: Article

References (40)

1. Dan Rose 1997 Solid State Technology, March 1997 issue p 45.
2. The National Technology Roadmap for Semiconductors 1994 SIA Semiconductor Industry Association, 4300 Stevens Creek Boulevard, San Jose, CA 95129, USA.
3. Dave Anderson 1997 Solid State Technology, March 1997 issue p 57
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