메뉴 건너뛰기




Volumn 46, Issue 6, 1997, Pages 1274-1279

Nonlinearity of a data-acquisition system with interleaving/multiplexing

Author keywords

Analog to digital conversion; Data acquisition; Multiplexing; Nonlinearities; Quantization, testing

Indexed keywords

COMPUTER SIMULATION; DATA ACQUISITION; MATHEMATICAL MODELS; MULTIPLEXING;

EID: 0031388281     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.668271     Document Type: Article
Times cited : (20)

References (7)
  • 1
    • 0024018237 scopus 로고
    • Digital spectra of nonuniformly sampled signals: Fundamentals and high-speed waveform digitizers
    • June
    • Y.-C. Jenq, "Digital spectra of nonuniformly sampled signals: Fundamentals and high-speed waveform digitizers," IEEE Trans. Instrum. Meas., vol. 37, pp. 245-251, June 1988.
    • (1988) IEEE Trans. Instrum. Meas. , vol.37 , pp. 245-251
    • Jenq, Y.-C.1
  • 2
    • 0025383716 scopus 로고
    • Digital spectra of nonuniformly sampled signals: Robust sampling time offset estimation algorithm for ultra high-speed waveform digitizers using interleaving
    • Feb.
    • _, "Digital spectra of nonuniformly sampled signals: Robust sampling time offset estimation algorithm for ultra high-speed waveform digitizers using interleaving," IEEE Trans. Instrum. Meas., vol. 39, pp. 71-75, Feb. 1990.
    • (1990) IEEE Trans. Instrum. Meas. , vol.39 , pp. 71-75
  • 5
    • 0026204176 scopus 로고
    • Determining ADC effective number of bits via histogram testing
    • Aug.
    • M. F. Wagdy and S. S. Awad, "Determining ADC effective number of bits via histogram testing," IEEE Trans. Instrum. Meas., vol. 40, pp. 770-772, Aug. 1991.
    • (1991) IEEE Trans. Instrum. Meas. , vol.40 , pp. 770-772
    • Wagdy, M.F.1    Awad, S.S.2
  • 6
    • 0026985395 scopus 로고
    • A/D converter performance analysis by a frequency domain approach
    • Dec.
    • L. Benetazzo, C. Narduzzi, C. Offelli, and D. Petri, "A/D converter performance analysis by a frequency domain approach," IEEE Trans. Instrum. Meas., vol. 41, pp. 834-839, Dec. 1992.
    • (1992) IEEE Trans. Instrum. Meas. , vol.41 , pp. 834-839
    • Benetazzo, L.1    Narduzzi, C.2    Offelli, C.3    Petri, D.4
  • 7
    • 33747408811 scopus 로고
    • Analog devices
    • Analog Devices, Inc., Norwood, MA
    • "Analog devices," in High Speed Analog Seminar, Analog Devices, Inc., Norwood, MA, 1990.
    • (1990) High Speed Analog Seminar


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.