Analysis of the optical properties of thin films using the transmission line method

Optica Applicata

Volumn 27, Issue 2, 1997, Pages 121-141

  Abu El Haija, A J ^a,b  

^a AL AL BAYT UNIVERSITY   (Jordan)

^b UNIVERSITY OF JORDAN   (Jordan)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CONDUCTIVE FILMS; CRYSTAL STRUCTURE; DIELECTRIC FILMS; MATHEMATICAL MODELS; MULTILAYERS; NUMERICAL METHODS; OPTICAL PROPERTIES; SUPERLATTICES;

CHARACTERISTIC MATRIX TECHNIQUE; TRANSMISSION LINE MATRIX METHOD;

THIN FILMS;

EID: 0031387574     PISSN: 00785466     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (13)

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