ASIC manufacturing test cost prediction at early design stage

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 356-361

  Kim, Von Kyoung ^a   Chen, Tom ^a   Tegethoff, Mick ^a  

^a SPARC Technology Business ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COST ACCOUNTING; INTEGRATED CIRCUIT MANUFACTURE; OPTIMIZATION;

TEST COST PREDICTION MODEL;

INTEGRATED CIRCUIT TESTING;

EID: 0031387343     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)