Investigation on VLSIs' input ports susceptibility to conducted RF interference

IEEE International Symposium on Electromagnetic Compatibility

Volumn , Issue , 1997, Pages 326-329

  Fiori, Franco ^a   Benelli, Simone ^a   Gaidano, Giorgio ^a   Pozzolo, Vincenzo ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; ELECTROMAGNETIC WAVE INTERFERENCE; ELECTRON BEAMS; INTEGRATED CIRCUIT TESTING; VOLTAGE MEASUREMENT;

RADIOFREQUENCY (RF) INTERFERENCE; SUSCEPTIBILITY MEASUREMENT;

VLSI CIRCUITS;

EID: 0031385344     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)