Critical evaluation of today's thermoelectric modules

International Conference on Thermoelectrics, ICT, Proceedings

Volumn , Issue , 1997, Pages 619-623

  Ritzer, Todd M ^a   Lau, Paul G ^a   Bogard, Andy D ^a  

^a TE Technology Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH TEMPERATURE TESTING; THERMAL CYCLING;

THERMOELECTRIC MODULES;

THERMOELECTRICITY;

EID: 0031385311     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)