Buried triple p-n junction structure in a BiCMOS technology for color detection

Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting

Volumn , Issue , 1997, Pages 108-111

  Chouikha, M Ben ^a   Lu, G N ^a   Sedjil, M ^a   Sou, G ^a   Alquie, G ^a  

^a SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; COLORIMETRY; COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR JUNCTIONS;

COLOR DETECTION;

CMOS INTEGRATED CIRCUITS;

EID: 0031384984     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)