Application of a yield model merging critical areas and defectivity data to industrial products

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 1997, Pages 11-19

  Levasseur, Sandra ^a   Duvivier, Frederic ^a  

^a STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED SOFTWARE ENGINEERING; INTEGRATED CIRCUIT MANUFACTURE; SEMICONDUCTOR DEVICE MODELS;

SURVEY SAMPLING BASED ESTIMATION TOOLS;

VLSI CIRCUITS;

EID: 0031384913     PISSN: 10636722     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)