Design and testing of high power, repetitively pulsed, solid-state closing switches

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 2, Issue , 1997, Pages 1022-1028

  Boenig, Heinrich J ^a   Schwartzenberg, John W ^a   Willinger, Lawrence J ^a   Piccone, Dante E ^a   Lopez, Duane A ^a   Smolleck, Howard A ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRON DEVICE TESTING; THYRISTORS;

CYCLIC STRESS LOADING; PULSED CLOSING SWITCHES;

SEMICONDUCTOR SWITCHES;

EID: 0031384615     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)