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Volumn 44, Issue 12, 1997, Pages 2180-2186

Effect of i-layer parameters on the performance of Si n+-i-n+ homojunction far-infrared detectors

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC SPACE CHARGE; ELECTRON TUNNELING; PHOTOEMISSION; SEMICONDUCTING SILICON; SEMICONDUCTOR JUNCTIONS; SPURIOUS SIGNAL NOISE;

EID: 0031384590     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.644633     Document Type: Article
Times cited : (3)

References (15)
  • 9
    • 0026157083 scopus 로고    scopus 로고
    • 1-x strained layers Solid-State Electron. vol. 34 pp. 453-465 1991.
    • 1-x strained layers Solid-State Electron. vol. 34 pp. 453-465 1991.
    • x
    • Jain, S.C.1    Roulston, D.J.2
  • 12
    • 33747681865 scopus 로고    scopus 로고
    • M. A. Lampert and P. Mark Current Injection In Solids. New York: Academic 1970.
    • Lampert, M.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.