Trade-off in IGBT safe operating area and performance parameters

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 2, Issue , 1997, Pages 949-954

  Trivedi, Malay ^a   Shenai, Krishna ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; INTEGRATED CIRCUIT LAYOUT;

FORWARD VOLTAGE DROP; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); SAFE OPERATING AREA (SOA); SWITCHING TIME;

BIPOLAR TRANSISTORS;

EID: 0031384563     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)