Dynamic threshold body- and gate-coupled SOI ESD protection networks

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1997, Pages 210-220

  Voldman, S ^a   Assaderaghi, F ^a   Mandelman, J ^a   Hsu, L ^a   Shahidi, G ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATICS; GATES (TRANSISTOR); MOSFET DEVICES; SILICON ON INSULATOR TECHNOLOGY;

BODY COUPLING TECHNIQUES; ELECTROSTATIC DISCHARGES (ESD) PROTECTION NETWORKS;

ELECTRIC DISCHARGES;

EID: 0031383745     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/eosesd.1997.634245     Document Type: Conference Paper

References (13)