Design criteria for a fully depleted-0.1 μm SOI technology

IEEE International SOI Conference

Volumn , Issue , 1997, Pages 78-79

  Burns, J A ^a   Frankel, R S ^a   Soares, A M ^a   Wyatt, P W ^a  

^a MIT LINCOLN LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BORON; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; LEAKAGE CURRENTS; OSCILLATORS (ELECTRONIC);

BURIED OXIDE (BOX); RING OSCILLATORS; SOFTWARE PACKAGE HSPICE;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0031383716     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)