Pressure dependence of the void size in silica studied by positron annihilation

Materials Science Forum

Volumn 255-257, Issue , 1997, Pages 469-471

  Hugenschmidt, C ^a   Maier, K ^a  

^a UNIVERSITY OF BONN   (Germany)

Author keywords

Amorphous Structure; High Pressure; Positronium; Silica; Void

Indexed keywords

ALUMINUM; AMORPHOUS MATERIALS; DOPING (ADDITIVES); HIGH PRESSURE EFFECTS IN SOLIDS; HYDROSTATIC PRESSURE; POLYMETHYL METHACRYLATES; SPECTROSCOPIC ANALYSIS;

POSITRON ANNIHILATION SPECTROSCOPY; POSITRONIUM;

SILICA;

EID: 0031383448     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.255-257.469     Document Type: Article

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