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Volumn 302, Issue , 1997, Pages 121-126
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Time-resolved x-ray studies of layer behaviour during operation of a ferroelectric device
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC FIELD EFFECTS;
FERROELECTRIC DEVICES;
X RAY DIFFRACTION ANALYSIS;
CHEVRON STRUCTURE;
LIQUID CRYSTAL DEVICES;
LIQUID CRYSTALS;
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EID: 0031381318
PISSN: 1058725X
EISSN: None
Source Type: Journal
DOI: 10.1080/10587259708041817 Document Type: Article |
Times cited : (3)
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References (14)
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