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Volumn 302, Issue , 1997, Pages 121-126

Time-resolved x-ray studies of layer behaviour during operation of a ferroelectric device

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; FERROELECTRIC DEVICES; X RAY DIFFRACTION ANALYSIS;

EID: 0031381318     PISSN: 1058725X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10587259708041817     Document Type: Article
Times cited : (3)

References (14)
  • 8
    • 4143148499 scopus 로고    scopus 로고
    • Merck Ltd., Merck House, Poole, Dorset, U.K.,BH15 1TD
    • Merck Ltd., Merck House, Poole, Dorset, U.K.,BH15 1TD.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.