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Volumn 467, Issue , 1997, Pages 451-456
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Absorption study of microcrystalline silicon deposited hot-wire CVD
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ABSORPTION SPECTROSCOPY;
BAND STRUCTURE;
CHEMICAL VAPOR DEPOSITION;
CRYSTAL STRUCTURE;
ELECTRON TRANSITIONS;
FILM PREPARATION;
LIGHT ABSORPTION;
VOLUME FRACTION;
X RAY DIFFRACTION ANALYSIS;
BAND GAP;
HOT WIRE CHEMICAL VAPOR DEPOSITION;
INTERBAND TRANSITION;
MICROCRYSTALLINE SILICON;
PHOTOTHERMAL DEFLECTION SPECTROSCOPY;
SEMICONDUCTING SILICON;
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EID: 0031381021
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (9)
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