Real time defect detection using image segmentation

IEEE International Symposium on Industrial Electronics

Volumn 2, Issue , 1997, Pages 713-716

  Miteran, Johel ^a   Geveaux, Pierre ^a   Bailly, Remy ^a   Gorria, Patrick ^a  

^a UNIVERSITÉ DE BOURGOGNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FEATURE EXTRACTION; IMAGE SEGMENTATION; LOGIC GATES; REAL TIME SYSTEMS;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA); REAL TIME DEFECT DETECTION;

COMPUTER INTEGRATED MANUFACTURING;

EID: 0031380726     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)