Putting the squeeze on test sequences

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 723-732

  Rudnick, Elizabeth M ^a   Patel, Janak H ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; SEQUENTIAL CIRCUITS;

DYNAMIC TEST SEQUENCE COMPACTION;

INTEGRATED CIRCUIT TESTING;

EID: 0031380359     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (33)