Cellular automata for weighted random pattern generation

IEEE Transactions on Computers

Volumn 46, Issue 11, 1997, Pages 1219-1229

  Neebel, Danial J ^a,b   Kime, Charles R ^a,c  

^a IEEE   (United States)

^b JAMES MADISON UNIVERSITY   (United States)

^c Wisconsin Electric Machines and Power Electronics Consortium   (United States)

Author keywords

Built in self test; Cellular automata; Hybrid cellular automata; Multiple weight sets; Test per clock pattern generation; Weighted cellular automata; Weighted random patterns

Indexed keywords

AUTOMATA THEORY; COMPUTER CIRCUITS; RANDOM PROCESSES;

BUILT IN SELF TEST (BIST); CELLULAR AUTOMATA; DESIGN FOR TESTABILITY (DFT); WEIGHTED RANDOM PATTERN GENERATION;

INTEGRATED CIRCUIT TESTING;

EID: 0031380202     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.644297     Document Type: Article

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