FTIR, EPMA, Auger, and XPS analysis of impurity precipitates in CdS films

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 1997, Pages 399-402

  Webb, John D ^a   Rose, Doug H ^a   Niles, David W ^a   Swartzlander, Amy ^a   Al Jassim, Mowafak M ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTAL IMPURITIES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PHOTOVOLTAIC CELLS; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING FILMS; SEMICONDUCTOR GROWTH; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL BATH DEPOSITION (CBD); IMPURITY PRECIPITATES;

CADMIUM SULFIDE SOLAR CELLS;

EID: 0031380170     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)