Analysis and modification of amorphous and partially-crystalline thin films

Materials Research Society Symposium - Proceedings

Volumn 498, Issue , 1997, Pages 67-76

  DiNardo, N J ^a   Mercer, T W ^a   Martinez Miranda, L J ^a   Siegal, M P ^a   Friedmann, T A ^a   Sullivan, J P ^a   Plank, R V ^a   Vohs, J M ^a  

^a DREXEL UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CHARACTERIZATION; CRYSTALLINE MATERIALS; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; ELECTRONIC PROPERTIES; FILM GROWTH; INTERFACES (MATERIALS); MODIFICATION; PLASTIC FILMS; STRUCTURE (COMPOSITION); SURFACES;

AMORPHOUS TETRAHEDRAL CARBON; AMORPHOUS THIN FILM; INELASTIC SCATTERING SPECTROSCOPY; PARTIALLY CRYSTALLINE THIN FILM; POLYANILINE THIN FILM;

THIN FILMS;

EID: 0031380149     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-498-67     Document Type: Conference Paper

References (23)