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Volumn 2, Issue , 1997, Pages 1103-1105
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Nanosecond-discharge-assisted selective separation of fine inclusions not involved in the impurity lattice
a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
BENEFICIATION;
CRYSTAL LATTICES;
GRINDING (MACHINING);
IMPURITIES;
FINE INCLUSIONS;
ELECTRIC BREAKDOWN;
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EID: 0031380094
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (3)
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