Sr Content dependence of ferroelectric properties in SrBi2Ta2O9 thin films

Integrated Ferroelectrics

Volumn 15, Issue 1-4, 1997, Pages 127-135

  Hase, Takashi ^a   Noguchi, Takehiro ^a   Amanuma, Kazushi ^a   Miyasaka, Yoichi ^a  

^a NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; FERROELECTRICITY; FILM PREPARATION; GRAIN GROWTH; STOICHIOMETRY; STRONTIUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

STRONTIUM BISMUTH TANTALATE THIN FILMS;

DIELECTRIC FILMS;

EID: 0031378794     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589708015703     Document Type: Article

References (7)

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7. R. E. Newnham, R. W. Wolfe and J. F. Dorrian, Mater. Res. Bull., 6, 1029(1971)