Test generation for primitive path delay faults in combinational circuits

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1997, Pages 636-641

  Tekumalla, Ramesh C ^a   Menon, Prem R ^a  

^a UNIVERSITY OF MASSACHUSETTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS;

PRIMITIVE PATH DELAY FAULTS;

COMBINATORIAL CIRCUITS;

EID: 0031378507     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iccad.1997.643605     Document Type: Conference Paper

References (18)