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Volumn , Issue , 1997, Pages 222-227

On acceleration of logic circuits optimization using implication relations

Author keywords

[No Author keywords available]

Indexed keywords

IMPLICATION RELATIONS; MULTILEVEL LOGIC OPTIMIZATION METHOD; REDUNDANCY IDENTIFICATION METHOD;

EID: 0031377636     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (9)
  • 1
    • 0346382368 scopus 로고
    • One-pass redundancy identification and removal
    • M. Abramovici and M. A. Iyer, "One-Pass Redundancy Identification and Removal, " Proc. Int'l Test Conf., pp. 807-815, 1992.
    • (1992) Proc. Int'l Test Conf. , pp. 807-815
    • Abramovici, M.1    Iyer, M.A.2
  • 2
    • 0028712931 scopus 로고
    • Perturb and simplify: Multi-level boolean network optimizer
    • S. C. Chang and M. M. Sadowska, "Perturb and Simplify: Multi-level Boolean Network Optimizer, " Int'l Conf on CAD, pp. 2-5, 1994.
    • (1994) Int'l Conf on CAD , pp. 2-5
    • Chang, S.C.1    Sadowska, M.M.2
  • 3
    • 0002603324 scopus 로고
    • Multi-level logic optimization by implication analysis
    • W. Kunz and P. R. Menon, "Multi-Level Logic Optimization by Implication Analysis, " Int'l Conf on CAD, 1994.
    • (1994) Int'l Conf on CAD
    • Kunz, W.1    Menon, P.R.2
  • 4
    • 84961249468 scopus 로고
    • Recursive learning: An attractive alternative to the decision tree for test generation in digital circuits
    • W. Kunz and P. R. Menon, "Recursive Learning: An Attractive Alternative to the Decision Tree for Test Generation in Digital Circuits, " Proc. Int'l Test Conf, pp. 816-825, 1992.
    • (1992) Proc. Int'l Test Conf , pp. 816-825
    • Kunz, W.1    Menon, P.R.2
  • 5
    • 0028115179 scopus 로고
    • Low-cost redundancy identification for combinational circuits
    • India
    • M. A. Iyer and M. Abramovici, "Low-Cost Redundancy Identification for Combinational Circuits, " Proc. 7th. Int'l. Conf. on VLSI Design, India, pp. 315-318, 1994.
    • (1994) Proc. 7th. int'L. Conf. on VLSI Design , pp. 315-318
    • Iyer, M.A.1    Abramovici, M.2
  • 7
    • 33746161404 scopus 로고    scopus 로고
    • On invariant implication relations for removing partial circuits
    • in Japanese
    • Hideyuki Ichihara, Seiji Kajihara and Kozo Ki-noshita, "On Invariant Implication Relations for Removing Partial Circuits, " IEICE Trans. D-I, Vol. J79-D-I, No. 12, pp. 1037-1045, 1996 (in Japanese).
    • (1996) IEICE Trans. D-I , vol.J79-D-I , Issue.12 , pp. 1037-1045
    • Ichihara, H.1    Kajihara, S.2    Ki-Noshita, K.3
  • 8
    • 0023865139 scopus 로고
    • SOCRATES: A highly efficient automatic test pattern generation system
    • CAD
    • Michael H. Schulz, Erwin Trischler and Thomas M. Sarfert, "SOCRATES: A Highly Efficient Automatic Test Pattern Generation System, " IEEE Trans. CAD, pp. 126-137, 1988.
    • (1988) IEEE Trans , pp. 126-137
    • Schulz, M.H.1    Trischler, E.2    Sarfert, T.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.