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Volumn 1, Issue , 1997, Pages 47-58

Syrinx technological program, developments and recent results

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC VARIABLES MEASUREMENT; ELECTRONIC EQUIPMENT TESTING; OPTIMIZATION; PLASMA SOURCES; RADIATION; RELIABILITY;

EID: 0031377212     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (15)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.