Performance and reliability of InAlAs/InGaAs/InP HEMTs technology for millimeter wave applications

GaAs Reliability Workshop, Proceedings

Volumn , Issue , 1997, Pages 62-64

  Chou, Y C ^a   Leung, D ^a   Lai, R ^a   Chen, Y C ^a   Li, G P ^a   Barsky, M ^a   Wu, C S ^a   Liu, P H ^a   Scarpulla, J ^a   Streit, D C ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; FAILURE ANALYSIS; MILLIMETER WAVES; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; RELIABILITY; SEMICONDUCTING INDIUM PHOSPHIDE; TRANSCONDUCTANCE;

BASE PLATE TEMPERATURE; MEAN TIME TO FAILURE;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 0031377154     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)