Symbolic simulation-based ANSI/IEEE Std 1149.1 compliance checker and BSDL generator

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 256-264

  Singh, Harbinder ^a   Patankar, Girish ^a   Beausang, James ^a  

^a SYNOPSYS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; LOGIC CIRCUITS; STANDARDS;

BOUNDARY SCAN DESCRIPTION LANGUAGE (BSDL); REGISTER TRANSFER LEVEL (RTL);

INTEGRATED CIRCUIT TESTING;

EID: 0031376344     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)