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Volumn 1, Issue , 1997, Pages
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Apple damage segmentation utilizing reflectance spectra of the defect
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Author keywords
[No Author keywords available]
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Indexed keywords
DEFECTS;
FRUITS;
QUALITY CONTROL;
DEFECT DETECTION;
REFLECTANCE SPECTRA;
IMAGE SEGMENTATION;
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EID: 0031376082
PISSN: 01450166
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (0)
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