The use of voltage to accelerate the endurance degradation of PZT capacitors

Integrated Ferroelectrics

Volumn 16, Issue 1-4, 1997, Pages 219-227

  Hadnagy, T D ^a   Traynor, S D ^a   Dalton, D I ^a  

^a Ramtron International Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; FATIGUE OF MATERIALS; LEAD COMPOUNDS; MATHEMATICAL MODELS;

LEAD ZIRCONATE TITANATE;

CAPACITORS;

EID: 0031375537     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589708013044     Document Type: Article

References (9)

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5. K. Amanuma, T. Hase and Y. Miyasaka, Jpn. J. Appl. Phys. (33), 5211-5214 (1994).
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7. H.M. Duiker, P.D. Beale, J.F. Scott, C.A. Paz de Araujo, B.M. Melnick, J.D. Cuchiaro and L.D. McMillan, J. Appl. Phys. (68), 5783-5791 (1990).
8. C.A. Paz De Araujo, R. Zuleeg, T. Mihara, H. Watanabe, A. Carrico, L.D. McMillan, J.F. Scott, Statistical Theory of Fatigue in Ferroelectric Devices, Integrated Ferroelectrics, 1992, Vol. 1. pp. 305-322.
9. P.K. Larsen, R. Jannsen, M. de Keijser, G.J.M. Dormans, P.J. van Veldhoven, G.A. C.M. Spierings, R. Cuppens and M. Ulenaers, 7th International Symposium on Integrated Ferroelectrics, March 20-22, 1995, Colorado Springs, Colorado.