Band gap measurement of the sintered Cdx Se1-x films from reflectance measurement

Solid State Phenomena

Volumn 55, Issue , 1997, Pages 40-42

  Sharma, S K ^a,b   Kumar, V ^a   Kaushish, S K ^a   Sharma, T P ^a  

^a CH CHARAN SINGH UNIVERSITY   (India)

^b NAS (PG) College   (India)

Author keywords

Band Gap; Reflection; Sintering; X Ray Diffraction Pattern

Indexed keywords

ENERGY GAP; FILM PREPARATION; REFLECTOMETERS; SCREEN PRINTING; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING GLASS; SINTERING; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CADMIUM SELENIDE FILMS; REFLECTION SPECTRA;

SEMICONDUCTING FILMS;

EID: 0031375107     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Article

References (5)

1. T Gruszecki And B Holmstrom ,Solar energy materials and solar cells (North - Holland) 31(1993) p. 227-234
2. M.S.Shaalan and J.Muller, Solar cells 28 (1990) p. 185-192.
3. J.Tauc. , Amorphous and liquid semiconductors, J. Tauc Ed. (Plenum .New York, 1974) p. 159.
4. T.P.Sharma, Sachin Kr.Sharma and V.Singh C.S.I.O.communication, Vol 19, No.3-4, July-Dec.(1992) p.63-66.
5. O.S.Heavens, Optical properties of thin solid films, Dover Publications, Inc. New York (1965).