Robustness of the exponential sequential probability ratio test (SPRT) when Weibull distributed failures are transformed using a "known" shape parameter

Microelectronics Reliability

Volumn 37, Issue 12, 1997, Pages 1835-1840

  Hauck, Daryl J ^a   Keats, J Bert ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; PARAMETER ESTIMATION; PROBABILITY; RANDOM PROCESSES; SENSITIVITY ANALYSIS; WEIBULL DISTRIBUTION;

SEQUENTIAL PROBABILITY RATIO TEST (SPRT); WEIBULL SHAPE PARAMETER;

INTEGRATED CIRCUIT TESTING;

EID: 0031374670     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(96)00287-9     Document Type: Article

References (9)

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