Polarization characterization of self-imaging GaAs/AlGaAs waveguide beamsplitters using Mueller matrix imaging polarimetry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2994, Issue , 1997, Pages 330-337

  Smith, Matthew H ^a   Sornsin, Elizabeth A ^a   Tayag, Tristan J ^a   Chipman, Russell A ^a  

^a UNIVERSITY OF ALABAMA IN HUNTSVILLE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; IMAGE PROCESSING; LIGHT POLARIZATION; MAPPING; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE;

BEAM SPLITTERS; MUELLER MATRIX IMAGING POLARIMETRY; PHASE RETARDANCE;

OPTICAL WAVEGUIDES;

EID: 0031374633     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)