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Volumn 258-263, Issue PART 1, 1997, Pages 491-496
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Isolated substitutional silver and silver-induced defects in silicon: An electron paramagnetic resonance investigation
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Author keywords
Electron paramagnetic resonance; Hyperfine interaction; Silicon; Silver
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Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
CRYSTAL DEFECTS;
CRYSTAL IMPURITIES;
CRYSTAL SYMMETRY;
DIFFUSION IN SOLIDS;
ELECTRON SPIN RESONANCE SPECTROSCOPY;
ELECTRONIC STRUCTURE;
ISOTOPES;
SEMICONDUCTOR DOPING;
SILVER;
HYPERFINE INTERACTION;
SEMICONDUCTING SILICON;
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EID: 0031374061
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.258-263.491 Document Type: Article |
Times cited : (2)
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References (15)
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