Experiences with implementation of IDDQ test for Identification & Automotive products

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 127-135

  Arnold, Ralf ^a   Bode, Thorsten ^a   Feuser, Markus ^a   Wedekind, Horst Udo ^a  

^a PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOBILE ELECTRONIC EQUIPMENT; AUTOMOBILES; CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; COMPUTER SOFTWARE; MICROPROCESSOR CHIPS; QUALITY ASSURANCE; SMART CARDS; TRANSPONDERS;

COMPUTER AIDED TEST SOFTWARE;

INTEGRATED CIRCUIT TESTING;

EID: 0031374038     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)