Failure Analysis of VLSI by IDDQ Testing

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 11, Issue 3, 1997, Pages 273-283

  Haehn, Steven ^a   Kalkur, T S ^b  

^a Symbios Logic   (United States)

^b UNIVERSITY OF COLORADO   (United States)

Author keywords

Failure analysis; Fault diagnosis; Quiescent current measurement; Scanning electron microscope

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; COMPUTER SOFTWARE; ELECTRIC CURRENT MEASUREMENT; FAILURE ANALYSIS; LOGIC DESIGN; SCANNING ELECTRON MICROSCOPY; VECTORS; VLSI CIRCUITS;

FAULT DIAGNOSIS; FAULT MODEL TEST PROGRAM; QUIESCENT CURRENT SIGNATURE SCAN ANALYSIS;

INTEGRATED CIRCUIT TESTING;

EID: 0031373715     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008222607359     Document Type: Article

References (10)

1. J.M. Soden and R.E. Anderson, "IC Failure Analysis Techniques and Tools for Quality and Reliability Improvement," Proc. of IEEE, Vol. 81, pp. 703-715, May 1993.
2. C.F. Hawkins, J.M. Soden, E.J. Cole, Jr., and E.S. Snyder, "The Use of Light Emission in Failure Analysis of CMOS ICs," Proc. of International Conference on Testing and Failure Analysis, ISTFA, 1990, pp. 55-67.
3. E. Menzel and E. Kubalek, "Fundamentals of Electron Beam Testing of Circuits," Scanning Microscopy, pp. 103-110, 1983.
4. J. Melngails, "Critical Review: Focussed Ion Beam and Applications," J. of Vacuum Science and Technology, Vol. 35, pp. 469-495, March-April 1987.
5. T.W. Lee and S.V. Pabbisetty, Microelectronic Failure Analysis, ASM International, Materials Park, OH, 1993.
6. A.H. Landzberg, Microelectronics Manufacturing Diagnostics Handbook, Van Nostrand Reinhold, New York, 1993.
7. DDQ," Journal of Electronic Testing: Theory and Application, Vol. 3, pp. 362-371, 1992.
8. DDQ Testing; A Review," Journal of Electronic Testing: Theory and Application, Vol. 3, pp. 291-303, 1992.
9. J.A. Segura, V.H. Compac, R. Rodrigues-Montanes, J. Figuras, and J.A. Rubio, "Quiscent Current Analysis and Experimentation of Defective CMOS Circuits," Journal of Electronic Testing: Theory and Application, Vol. 3, p. 337, 1992.
10. DDQ Testing and Defect Classes, A Tutorial," Proc. Custom Integrated Circuits Conference, pp. 633-642, 1995.