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Volumn 2921, Issue , 1997, Pages 584-591
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Measurement of residual stress using fiber electronic speckle pattern interferometry
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COPPER;
CRYSTALS;
DEFORMATION;
INTERFEROMETRY;
MECHANICS;
PHOTOGRAPHY;
SCANNING ELECTRON MICROSCOPY;
SPECKLE;
ELECTRONIC SPECKLE PATTERN INTERFEROMETRY;
EXPERIMENTAL MECHANICS;
MICROMECHANICS;
RESIDUAL STRESSES;
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EID: 0031372847
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (10)
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