High-resolution electron microscopy and low-temperature electron diffraction studies of a Bi2212 single crystal grown by the floating zone method

Journal of Superconductivity

Volumn 10, Issue 6, 1997, Pages 649-655

  Sun, W ^a   Kimoto, T ^a   Mochiku, T ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

High resolution electron microscopy; Lattice anomaly; Low temperature electron diffraction; Single crystal of Bi2Sr2CaCu2O8

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL GROWTH; CRYSTAL LATTICES; CRYSTAL SYMMETRY; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; HIGH TEMPERATURE SUPERCONDUCTORS; SINGLE CRYSTALS; THERMAL EFFECTS; X RAY CRYSTALLOGRAPHY;

CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); FLOATING ZONE METHOD;

OXIDE SUPERCONDUCTORS;

EID: 0031372738     PISSN: 08961107     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02471927     Document Type: Article

References (32)

1. H. Maeda, Y. Tanaka, M. Fukutomi, and T. Asano, Jnp. J. Appl. Phys. 27, L209 (1988).
2. P. M. Horn, D. T. Keane, G. A. Held, J. L. Jordan-Sweet, D. L. Kaiser, F. Holtzberg, and T. M. Rice, Phys. Rev. Lett. 59, 2772 (1987).
3. X. Chen, R. Z. Ma, G. H. Cao, and Y. Li, Solid State Commun. 96, 957 (1995).
4. B. H. Toby, T. Egami, J. D. Jorgensen, and M. A. Subramanian, Phys. Rev. Lett. 64, 2414 (1990).
5. M. Arai, K. Yamada, Y. Hidaka, S. Ioth, Z. A. Bowden, A. D. Taylor, and Y. Endoh, Phys. Rev. Lett. 69, 359 (1992).
6. T. Nishida, Y. Takashima, M. Katada, Y. Matsumoto, and T. Arakawa, Physica C 191, 297 (1992).
7. L. Donzel, Y. Mi, and R. Schaller, Physica C 250, 75 (1995).
8. Y. He, B. Zhang, S. Lin, J. Xiang, Y. Lou, and H. Chen, J. Phys. F: Met. Phys. 17, L243 (1987).
9. Y. N. Wang, H. M. Shen, and M. Zhu, Phys. Lett. A 158, 413 (1991).
10. Y. N. Wang, J. Wu, H. M. Shen, J. S. Zhu, X. H. Chen, Y. F. Yan, and Z. X. Zhao, Phys. Rev. B 41, 8981 (1990).
11. H. Matsui, Y. Tada, M. Kiritani, and I. Nakagawa, Abstract of the Spring Meeting of JIM (1991), p. 352.
12. T. Mochiku and K. Kadowaki, Physica C 235-240, 523 (1994).
13. H. Budin, O. Eibl, P. Pongratz, and P. Skalicky, Physica C 207, 208 (1993).
14. R. Ramesh, G. van Tendeloo, G. Thomas, S. M. Green, and H. L. Luo, Appl. Phys. Lett. 53, 2220 (1988).
15. A. Sequeira, H. Rajagopal, and J. V. Yakhmi, Physica C 157, 515 (1989).
16. K. Imai, I. Makai, T. Kawashima, S. Sueno, and A. Ono, Jpn. J. Appl. Phys. 27, L1661 (1988).
17. P. Bordet, J. J. Capponi, C. Chaillout, J. Chenavas, A. W. Hewat, E. A. Hewat, J. L. Hodeau, M. Marezio, J. L. Tholence, and D. Tranqui, Physica C 156, 189 (1988).
18. P. Goodman, P. Miller, T. J. White, and R. L. Withers, Acta Crystallogr. B 48, 376 (1992).
19. A. W. S. Johnson, Acta Crystallogr. A 28, 89 (1984).
20. J. W. Steeds, in Introduction to Analytical Electron Microscopy, J. J. Hren, J. I. Goldstein, and D. C. Joy, eds. (Plenum Press, New York and London, 1979), pp. 387-422.
21. S. J. Rozeveld and J. M. Howe, Ultramicroscopy 50, 41 (1993).
22. H. J. Maier, R. R. Keller, H. Renner, H. Mughrabi, and A Preston, Philos. Mag. A 74, 23 (1996).
23. D. Mukherji and R. P. Wahi, Scri. Metall. 35, 117 (1996).
24. E. Kaldis, P. Fischer, A. W. Hewat, E. A. Hewat, J. Karpinkski, and S. Rusiecki, Physica C 159, 668 (1989).
25. A. Koizumi, H. Maruyama, H. Yamazaki, H. Maeda, T. Ishii, Y. Miura, and J. Takada, Physica C 190, 338 (1992).
26. J. Mustre de Leon, S. D. Conradson, I. Batistic, and A. R. Bishop, Phys. Rev. Lett. 65, 1675 (1990).
27. T. Ruf, C. Thomsen, R. Liu, and M. Cardona, Phys. Rev. B 38, 11985 (1988).
28. T. Haga, K. Yamaya, Y. Abe, Y. Tajima, and Y. Hidaka, Phys. Rev. B 41, 826 (1990).
29. M. Arai, K. Yamada, S. Hosoya, A. C. Hannon, Y. Hidaka, A. D. Taylor, and Y. Endoh, Bull. Electrotech. Lab. 58, 22 (1994).
30. A. Bianconi, M. Missori, H. Oyanagi, H. Yamaguchi, D. H. Ha, and Y. Nishihara, Bull. Electrotech. Lab. 58, 16 (1994).
31. M. Sato, Bull. Phys. Soc. Jpn. (Butsuri), 52, 174 (1997).
32. Y. He, J. Xiang, X. Wang, A. S. He, J. C. Zhang, and F. G. Chang, Phys. Rev. B 40, 7384 (1989).