Characterization of quaternary metal oxide films by synchrotron X-ray fluorescence microprobe

Applied Spectroscopy

Volumn 51, Issue 12, 1997, Pages 1781-1783

  Perry, D L ^a   Thompson, A C ^a   Russo, R E ^a   Mao, X L ^a   Chapman, K L ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Catalysts; Films; Synchrotron radiation; X ray fluorescence microprobe

Indexed keywords

COMPOSITION; FLUORESCENCE; LASER ABLATION; LIME; NICKEL COMPOUNDS; POTASSIUM COMPOUNDS; PROBES; PULSED LASER APPLICATIONS; SYNCHROTRON RADIATION; THIN FILMS; TRACE ANALYSIS; X RAY ANALYSIS;

PULSED LASER DEPOSITION (PLD); QUATERNARY METAL OXIDE FILMS; SYNCHROTRON X RAY FLUORESCENCE MICROPROBES;

CATALYSTS;

EID: 0031372576     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702971939749     Document Type: Article

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